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Proceedings Paper

Bond's method used for a double-crystal spectrometer equipped with a polycapillary halflens
Author(s): Ernst K. Kov'ev; Artem P. Malakho; Sergey N. Polyakov
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Paper Abstract

A new version of diffraction method for measuring the absolute values of intra-plane distances dhkl in crystals and epixtaxial films using Kumakhov's x-ray poly-capillary half-lenses was developed. An attachment attachment to general-purpose x-ray diffractometer MRD was develoepd to register diffractograms within the angle range between 0 ÷ 160° with error of Δhkl/d approximately 10-5. A method of precision dhkl measurement was verified using perfect quartz crystals.

Paper Details

Date Published: 30 July 2002
PDF: 4 pages
Proc. SPIE 4765, International Conference on X-ray and Neutron Capillary Optics, (30 July 2002); doi: 10.1117/12.489739
Show Author Affiliations
Ernst K. Kov'ev, Institute of Crystallography (Russia)
Artem P. Malakho, M.V. Lomonosov Moscow State Univ. (Russia)
Sergey N. Polyakov, M.V. Lomonosov Moscow State Univ. (Russia)


Published in SPIE Proceedings Vol. 4765:
International Conference on X-ray and Neutron Capillary Optics
Muradin A. Kumakhov, Editor(s)

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