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Proceedings Paper

Fluid-flow-rate metrology: laboratory uncertainties and traceabilities
Author(s): G. E. Mattingly
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Paper Abstract

Increased concerns for improved fluid flowrate measurement are driving the fluid metering community-meter manufacturers and users alike-to search for better verification and documentation for their fluid measurements. These concerns affect both our domestic and international market places they permeate our technologies - aerospace chemical processes automotive bioengineering etc. They involve public health and safety and they impact our national defense. These concerns are based upon the rising value of fluid resources and products and the importance of critical material accountability. These values directly impact the accuracy needs of fluid buyers and sellers in custody transfers. These concerns impact the designers and operators of chemical process systems where control and productivity optimization depend critically upon measurement precision. Public health and safety depend upon the quality of numerous pollutant measurements - both liquid and gaseous. The performance testing of engines - both automotive and aircraft are critically based upon accurate fuel measurements - both liquid and oxidizer streams. Fluid flowrate measurements are established differently from counterparts in length and mass measurement systems because these have the benefits of " identity" standards. For rate measurement systems the metrology is based upon " derived standards" . These use facilities and transfer standards which are designed built characterized and used to constitute basic measurement capabilities and quantify performance - accuracy and precision. Because " identity standards" do not exist for flow measurements facsimiles or equivalents must

Paper Details

Date Published: 1 March 1991
PDF: 16 pages
Proc. SPIE 1392, Advanced Techniques for Integrated Circuit Processing, (1 March 1991); doi: 10.1117/12.48932
Show Author Affiliations
G. E. Mattingly, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 1392:
Advanced Techniques for Integrated Circuit Processing
James A. Bondur; Terry R. Turner, Editor(s)

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