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Proceedings Paper

Submerged reflectance measurements as a function of visible wavelength
Author(s): John W. Giles; Kenneth John Voss
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Paper Abstract

Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.

Paper Details

Date Published: 1 December 1991
PDF: 7 pages
Proc. SPIE 1537, Underwater Imaging, Photography, and Visibility, (1 December 1991); doi: 10.1117/12.48878
Show Author Affiliations
John W. Giles, Johns Hopkins Univ. (United States)
Kenneth John Voss, Univ. of Miami (United States)


Published in SPIE Proceedings Vol. 1537:
Underwater Imaging, Photography, and Visibility
Richard W. Spinrad, Editor(s)

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