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Proceedings Paper

Array nonuniformity correction: new procedures designed for difficult measurement conditions
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Paper Abstract

For many types of infrared scene projectors, differences in the outputs of individual elements are one source of error in projecting a desired radiance scene. This is particularly true of resistor-array based infrared projectors. Depending on the sensor and application, the desired response uniformity may prove difficult to achieve. The properties of the sensor used to measure the projector outputs critically affect the procedures that can be used for nonuniformity correction (NUC) of the projector, as well as the final accuracy achievable by the NUC. In this paper we present a description of recent efforts to perform NUC of an infrared projector under “adverse” circumstances. For example, the NUC sensor may have some undesirable properties, including: significant random noise, large residual response nonuniformity, temporal drift in bias or gain response, vibration, and bad pixels. We present a procedure for reliably determining the output versus input response of each individual emitter of a resistor array projector. This NUC procedure has been demonstrated in several projection systems at the Kinetic Kill Vehicle Hardware-In-the-Loop Simulator (KHILS) including those within the KHILS cryogenic chamber. The NUC procedure has proven to be generally robust to various sensor artifacts.

Paper Details

Date Published: 12 September 2003
PDF: 11 pages
Proc. SPIE 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII, (12 September 2003); doi: 10.1117/12.488620
Show Author Affiliations
Breck A. Sieglinger, Consultant for MacAulay-Brown, Inc. (United States)
James D. Norman, Air Force Research Lab. (United States)
William M. Meshell, MacAulay-Brown, Inc. (United States)
David S. Flynn, Consultant for MacAulay-Brown, Inc. (United States)
Rhoe A. Thompson, Air Force Research Lab. (United States)
George C. Goldsmith, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 5092:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
Robert Lee Murrer, Editor(s)

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