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Proceedings Paper

High-resolution extended NIR camera
Author(s): Scott A. Cabelli; Jianmei Pan; Steven G. Bernd; William E. Tennant; John D. Blackwell; S. Bhargava; John G. Pasko; Eric C. Piquette; Dennis D. Edwall
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Paper Abstract

A High Resolution Near-Infrared (NIR) Camera has been developed and tested. This NIR camera uses a HgCdTe detector array which allows for imaging at high operating temperatures. The camera's format is 640x512 pixels with an 18 μm pitch. We have obtained high broadband spectral response from 0.9 to 2.0 micron with near 100% optical fill factor. The camera is designed as a turnkey system that uses the industry standard Camera Link digital interface. The electronics are located remotely from the sensor head allowing it to be adapted to existing optical systems. This compact camera has been targeted for military, scientific and telecommunication applications. This paper will detail the measured camera performance.

Paper Details

Date Published: 10 October 2003
PDF: 10 pages
Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); doi: 10.1117/12.488517
Show Author Affiliations
Scott A. Cabelli, Rockwell Scientific Co. (United States)
Jianmei Pan, Rockwell Scientific Co. (United States)
Steven G. Bernd, Rockwell Scientific Co. (United States)
William E. Tennant, Rockwell Scientific Co. (United States)
John D. Blackwell, Rockwell Scientific Co. (United States)
S. Bhargava, Rockwell Scientific Co. (United States)
John G. Pasko, Rockwell Scientific Co. (United States)
Eric C. Piquette, Rockwell Scientific Co. (United States)
Dennis D. Edwall, Rockwell Scientific Co. (United States)


Published in SPIE Proceedings Vol. 5074:
Infrared Technology and Applications XXIX
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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