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Proceedings Paper

Infrared/microwave correlation measurements
Author(s): John D. Norgard; Don W. Metzger; John C. Cleary; Michael F. Seifert
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Paper Abstract

An infrared (IR) measurement technique for determining two-dimensional (2-D) and three- dimensional (3-D) microwave field distributions is presented. This IR technique is used to verify predictions made by various numerical electromagnetic (EM) codes. The experimental technique is based on IR thermal measurements of the Joule heating induced in a lossy dielectric or resistive material used as a calibrated IR detection screen when microwave energy is absorbed by the screen. An IR scanning system records the thermal radiation from the screen. The intensity of the microwave field is related to variations in the surface temperature distribution. The detection screen material is of a thin, planar construction and, thus, produces a 2-D map of the microwave field. By moving the screen along the normal to its plane, samples of the 3-D field are obtained. This experimental approach has been applied to several 2-D and 3-D scattering and coupling problems. Comparisons are made between the theoretical and experimental results for various hollow slit cylinder configurations. The advantages, disadvantages and limitations of this IR thermal technique for validation of EM theoretical predictions are discussed.

Paper Details

Date Published: 1 December 1991
PDF: 10 pages
Proc. SPIE 1540, Infrared Technology XVII, (1 December 1991); doi: 10.1117/12.48776
Show Author Affiliations
John D. Norgard, Univ. of Colorado/Colorado Springs (United States)
Don W. Metzger, Univ. of Colorado/Colorado Springs (United States)
John C. Cleary, Rome Lab. (United States)
Michael F. Seifert, Rome Lab. (United States)

Published in SPIE Proceedings Vol. 1540:
Infrared Technology XVII
Bjorn F. Andresen; Marija Scholl; Irving J. Spiro, Editor(s)

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