Share Email Print
cover

Proceedings Paper

Effects of microscan operation on staring infrared sensor imagery
Author(s): Fred P. Blommel; Peter N. J. Dennis; Derek J. Bradley
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper presents excerpts from the data that was collected on the Microscan Flir Data Collection (MFDC) program conducted by the Wright Laboratory's Avionics Directorate (WL/AA) and the Royal Signals and Radar Establishment (RSRE). These data items describe the effects that microscanning has on imagery generated with staring flir sensors. The paper also includes a description of the microscan concept, and one of the unique Microscan Flir sensors developed by RSRE. The sensor was characterized in the Infrared Sensor Measurement Laboratory and used to collect imagery at variable sample rates on tactical targets at the E-O Sensor Tower Test Range. The laboratory data was used to demonstrate the effects of microscanning on flir performance parameters and on flir imagery of various periodic and aperiodic test patterns. A sampling of imagery from the tower tests is also presented to demonstrate the effects of microscanning on real world imagery.

Paper Details

Date Published: 1 December 1991
PDF: 12 pages
Proc. SPIE 1540, Infrared Technology XVII, (1 December 1991); doi: 10.1117/12.48763
Show Author Affiliations
Fred P. Blommel, Wright Lab. (United States)
Peter N. J. Dennis, Royal Signals and Radar Establishment (United Kingdom)
Derek J. Bradley, Royal Signals and Radar Establishment (United Kingdom)


Published in SPIE Proceedings Vol. 1540:
Infrared Technology XVII
Bjorn F. Andresen; Marija Scholl; Irving J. Spiro, Editor(s)

© SPIE. Terms of Use
Back to Top