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Proceedings Paper

Raman and scanning electron microscopy measurements of RDX on glass substrates
Author(s): Perla Torres; Liza Mercado; Lewis Mortimer; Nairmen Mina; Samuel P. Hernandez-Rivera; Richard T. Lareau; R. Thomas Chamberlain; Miguel E. Castro
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Paper Abstract

Trace explosive detection is a major technological challenge. Spectroscopic characterization of explosive traces is a major step toward explosive detection strategies and sensor development. We report here on white light imaging measurements and Raman microscopy, atomic force microscopy (AFM), scanning electron microscopy (SEM) and energy dispersed X ray analysis (EDX) for the characterization RDX nanoparticles deposited on glass substrates surfaces. The RDX nanoparticles were prepared by exposure of glass substrate surfaces to an aerosol jet containing RDX. An average RDX particle size of 300 nm is determined from the SEM measurements. The spectroscopic signature of the RDX nanoparticles between 750 and 950 cm-1 is dominated by the ring breathing mode centered at about 877 cm-1. The smallest particle characterized with vibrational spectroscopy measurements are about 750 nm in size.

Paper Details

Date Published: 11 September 2003
PDF: 11 pages
Proc. SPIE 5089, Detection and Remediation Technologies for Mines and Minelike Targets VIII, (11 September 2003); doi: 10.1117/12.487178
Show Author Affiliations
Perla Torres, Univ. of Puerto Rico at Mayaguez (United States)
Liza Mercado, Univ. of Puerto Rico at Mayaguez (United States)
Lewis Mortimer, Univ. of Puerto Rico at Mayaguez (United States)
Nairmen Mina, Univ. of Puerto Rico at Mayaguez (United States)
Samuel P. Hernandez-Rivera, Univ. of Puerto Rico at Mayaguez (United States)
Richard T. Lareau, Transportation Security Administration (United States)
R. Thomas Chamberlain, Transportation Security Administration (United States)
Miguel E. Castro, Univ. of Puerto Rico at Mayaguez (United States)


Published in SPIE Proceedings Vol. 5089:
Detection and Remediation Technologies for Mines and Minelike Targets VIII
Russell S. Harmon; John H. Holloway Jr.; J. T. Broach, Editor(s)

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