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Proceedings Paper

Spectroellipsometrical measurement of large roughness surface
Author(s): L. Yu. Melnichenko; B. B. Tytarchuk; Igor A. Shaykevich
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Paper Abstract

Spectroellipsometrical measurements are usually made on smooth surfaces or surfaces with small roughness. Practical needs often demand measuring optical parameters of real details and products. The surface of these dtails and products is not mirror-like, but veyr rough, that is Ra greater than/equal to λ. This work shows possibility of ellipsometrical measurements on very rough surfaces. We proposed the method of ellipsometrical measurement of these surfaces and made investigations for metal rough plates and semiconductor surfaces of the anodized aluminum. The most common method of measurement of spectroellipsometrical parameters is the Beatty method and its different modifications. Therefore it is for this method that we work out our own principles.

Paper Details

Date Published: 11 December 2002
PDF: 5 pages
Proc. SPIE 4938, Selected Papers from the International Conference on Spectroscopy of Molecules and Crystals, (11 December 2002); doi: 10.1117/12.486670
Show Author Affiliations
L. Yu. Melnichenko, Taras Shevchenko National Univ. (Ukraine)
B. B. Tytarchuk, Taras Shevchenko National Univ. (Ukraine)
Igor A. Shaykevich, Taras Shevchenko National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 4938:
Selected Papers from the International Conference on Spectroscopy of Molecules and Crystals
Galina A. Puchkovska; Sergey A. Kostyukevych, Editor(s)

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