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Proceedings Paper

Diffraction analysis of optical disk readout signal deterioration caused by mark-size fluctuation
Author(s): Yoshinori Honguh
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Paper Abstract

The author proposes a new noise power-spectrum estimation method for mark-dimension fluctuation in optical disks. Diffraction by marks was modeled using Fraunhofer diffraction theory, and mark-dimension fluctuations were taken into account through statistical averaging. The calculated and experimental results agreed well. Fluctuations in the mark edge position mainly contributed to noise.

Paper Details

Date Published: 1 December 1991
PDF: 7 pages
Proc. SPIE 1527, Current Developments in Optical Design and Optical Engineering, (1 December 1991); doi: 10.1117/12.48661
Show Author Affiliations
Yoshinori Honguh, Toshiba Corp. (Japan)

Published in SPIE Proceedings Vol. 1527:
Current Developments in Optical Design and Optical Engineering
Robert E. Fischer; Warren J. Smith, Editor(s)

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