Share Email Print
cover

Proceedings Paper

Optical properties of ZnxCd1-xS mixed-crystal thin film produced by PLD
Author(s): Hisashi Sakai; Mahiko Watanabe; Ken Takiyama; Bruno Ullrich
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Thin film of ZnxCd1-xS mixed crystal is applicable to short-wavelength optical devices from visible to UV region because of various band gaps. Using the pulsed laser deposition (PLD) method, we first produced the ZnxCd1-xS mixed crystal thin films. The surface morphology, the composition of x and the crystal structure of the thin films were observed with SEM, EDAX and XRD respectively. The lattice constant corresponding to (002) plane of hexagonal crystal linearly depends on x following the Vegard’s law. The crystal grains of the ZnxCd1-xS thin films have the c-axis perpendicular to the film surface and good crystallinity. The optical transmittance was measured at room temperature so that the optical band gaps of direct transition continuously increase from 2.43 eV (510 nm) to 3.63 eV (340 nm) with x. The continuous change of the band gap indicates solid solution formation.

Paper Details

Date Published: 19 February 2003
PDF: 4 pages
Proc. SPIE 4830, Third International Symposium on Laser Precision Microfabrication, (19 February 2003); doi: 10.1117/12.486578
Show Author Affiliations
Hisashi Sakai, Hiroshima Kokusai Gakuin Univ. (Japan)
Mahiko Watanabe, Hiroshima Kokusai Gakuin Univ. (Japan)
Ken Takiyama, Hiroshima Univ. (Japan)
Bruno Ullrich, Bowling Green State Univ. (United States)


Published in SPIE Proceedings Vol. 4830:
Third International Symposium on Laser Precision Microfabrication
Isamu Miyamoto; Kojiro F. Kobayashi; Koji Sugioka; Reinhart Poprawe; Henry Helvajian, Editor(s)

© SPIE. Terms of Use
Back to Top