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Proceedings Paper

Critical-angle refractometry: accuracy analysis
Author(s): Diana Tentori
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Paper Abstract

An analysis of the measuring accuracy that can be obtained using critical angle refractometry as a direct and an indirect method is made. The working conditions required to get the highest accuracy are discussed.

Paper Details

Date Published: 1 December 1991
PDF: 9 pages
Proc. SPIE 1527, Current Developments in Optical Design and Optical Engineering, (1 December 1991); doi: 10.1117/12.48652
Show Author Affiliations
Diana Tentori, CICESE (United States)


Published in SPIE Proceedings Vol. 1527:
Current Developments in Optical Design and Optical Engineering
Robert E. Fischer; Warren J. Smith, Editor(s)

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