Share Email Print
cover

Proceedings Paper

Research on CCD intersection measuring techniques in detecting multiple targets
Author(s): Menghong Feng; Lin Li; Yifan Huang; Liansheng An; Yongtian Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new method of CCD intersection measurement in detecting multiple targets is discussed, and the math-model for the coordinate measurement of CCD is set up. This method is different from conventional measurement method in that it is able to detect many targets at the same time according to diverse gray level. And this model can improve the measurement accuracy and increase computing speed.

Paper Details

Date Published: 23 December 2002
PDF: 3 pages
Proc. SPIE 4832, International Optical Design Conference 2002, (23 December 2002); doi: 10.1117/12.486435
Show Author Affiliations
Menghong Feng, Beijing Institute of Technology (China)
Lin Li, Beijing Institute of Technology (China)
Yifan Huang, Beijing Institute of Technology (China)
Liansheng An, Beijing Institute of Technology (China)
Yongtian Wang, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 4832:
International Optical Design Conference 2002
Paul K. Manhart; Jose M. Sasian, Editor(s)

© SPIE. Terms of Use
Back to Top