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Proceedings Paper

Laser thermal shock testing of neutron-irradiated sapphire
Author(s): Daniel C. Harris; Oscar Esquivel; Paul D. Chaffee; Ido Anteby; Rahav Ifergan; Malki Pinkas; Atara Horowitz; Haim Lotem; Thomas M. Regan; John J. Mecholsky Jr.
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Paper Abstract

Half of a set of sapphire disks was exposed to fast neutrons (0.8-10 MeV) at a fluence of 1022 neutrons/m2. Each 25-mm-diameter x 1-mm-thick disk was then exposed to a 10.6 μm CO2 laser (121 W/cm2) while the central 12.7-mm-diameter region of the disk was shielded from the laser. c-Plane disks that had not been exposed to neutrons survived 76% longer than a-plane disks that had not been exposed to neutrons. Neutron irradiation had no significant effect on time to failure of c-plane sapphire. However, neutron irradiation increased the survival time of a-plane sapphire by 30%-a result that was significant at the 99.9% confidence level. c-Plane disks were expected to fail in tension at the center of the disk. The calculated tensile stress at the mean failure time was ~700 MPa and the center temperature was ~400°C. By contrast, a-plane disks failed near the boundary between the shielded central region and the exposed outer annulus. The radial stress at this location is tensile and the hoop stress is compressive. Failure origins were at surface scratches. Rhombohedral twinning was observed in many a-plane disks, but there was no fractographic evidence that r-plane twinning caused failure. The mechanism by which neutron irradiation increases the time to failure of a-plane disks is unknown.

Paper Details

Date Published: 26 September 2003
PDF: 10 pages
Proc. SPIE 5078, Window and Dome Technologies VIII, (26 September 2003); doi: 10.1117/12.486393
Show Author Affiliations
Daniel C. Harris, Naval Air Systems Command (United States)
Oscar Esquivel, Aerospace Corp. (United States)
Paul D. Chaffee, Aerospace Corp. (United States)
Ido Anteby, Ben Gurion Univ. of the Negev (Israel)
Rahav Ifergan, Ben Gurion Univ. of the Negev (Israel)
Malki Pinkas, Rotem Industries Ltd. (Israel)
Atara Horowitz, Rotem Industries Ltd. (Israel)
Haim Lotem, Rotem Industries Ltd. (Israel)
Thomas M. Regan, Univ. of Massachusetts/Lowell (United States)
John J. Mecholsky Jr., Univ. of Florida (United States)

Published in SPIE Proceedings Vol. 5078:
Window and Dome Technologies VIII
Randal W. Tustison, Editor(s)

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