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Proceedings Paper

Polarity effects of polymer on the 193-nm resist performance
Author(s): Yong-Jun Choi; Jung-woo Kim; Jong-Yong Kim; Yoon-Gil Yim; Jae-Hyun Kim; Jaechang Jung; Myoung-Ja Min; Cheolkyu Bok; Kisoo Shin
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Paper Abstract

Hydrophilicity of a resist film is a major property to determine the compatibility of resist film and substrates. By incorporation of polar groups in the side chain of polymer, the hydrophilicity of polymer, eventually, the hydrophilicity of a resist film can be modified. Since most developer for photoresist is aqueous alkaline solution, the polar side groups control not only interaction with a substrate but also dissolution rate of the resist film. We have synthesized model polymers having various polar groups, and investigated the effect of the polarity on the 193nm resist photographic behavior. Acid, lactone, ether, and alcohol were selected as polar groups. Among them, various lactone and alcohol functional groups were selected for further study on the effect of the side group bulkiness. Hydrophilicity of each functional group was estimated by Log P, which can be calculated using simulation program. From the calculation, aliphatic alcohol and lactone have the highest polarity and ether has the lowest. However, the bulkiness of alcohol increases, the polarity is getting lower than that of ether. Polarity and bulkiness of the polar monomers (acid, lactone, ether, and alcohol group) affect wettability against developer, collapse in 1:1 L/S patterns and adhesion to substrates. The resist films have different contact angles by polarity, bulkiness and content of these monomers in polymer. The polymer including lactone group shows excellent lithographic performance and minimizes pattern collapse in 1:1 L/S. Furthermore, we investigated contrast, pattern profile and process margin of 193nm resist according to the polymer polarity.

Paper Details

Date Published: 12 June 2003
PDF: 8 pages
Proc. SPIE 5039, Advances in Resist Technology and Processing XX, (12 June 2003); doi: 10.1117/12.485160
Show Author Affiliations
Yong-Jun Choi, Dongjin Semichem Co., Ltd. (South Korea)
Jung-woo Kim, Dongjin Semichem Co., Ltd. (South Korea)
Jong-Yong Kim, Dongjin Semichem Co., Ltd. (South Korea)
Yoon-Gil Yim, Dongjin Semichem Co., Ltd. (South Korea)
Jae-Hyun Kim, Dongjin Semichem Co., Ltd. (South Korea)
Jaechang Jung, Hynix Semiconductor Co., Ltd. (South Korea)
Myoung-Ja Min, Hynix Semiconductor Co., Ltd. (South Korea)
Cheolkyu Bok, Hynix Semiconductor Co., Ltd. (South Korea)
Kisoo Shin, Hynix Semiconductor Co., Ltd. (South Korea)


Published in SPIE Proceedings Vol. 5039:
Advances in Resist Technology and Processing XX
Theodore H. Fedynyshyn, Editor(s)

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