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Proceedings Paper

HEIGHTS initial simulation of discharge-produced plamsa hydrodynamics and radiation transport for EUV lithography
Author(s): Ahmed Hassanein; Valeryi Sizyuk; Vladimir Tolkach; Vitali Morozov; Bryan J. Rice
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Paper Abstract

Discharge produced plasma (DPP) devices have been proposed as a light source for EUV lithography. A key challenge for DPP is achieving sufficient brightness to support the throughput requirements of exposure tools for high-volume manufacturing lithography. To simulate the environment of the EUV source and optimize the output of the source, an integrated model is being developed to describe the hydrodynamic and optical processes that occur in DPP devices. The model includes both plasma evolution and magnetohydrodynamic processes as well as detailed photon radiation transport. The total variation diminishing scheme in the Lax-Friedrich formulation for the description of magnetic compression and diffusion in a cylindrical geometry is used. Several models are being developed for opacity calculations; a collisional radiation equilibrium model, a self-consistent field model with Auger processes, and a non-stationary kinetic model. Radiation transport for both continuum and lines with detailed spectral profiles are taken into account. The developed models are integrated into the HEIGHTS-EUV computer simulation package. Preliminary results of a numerical simulation of xenon gas hydrodynamics and line radiation output are presented for various plasma conditions.

Paper Details

Date Published: 16 June 2003
PDF: 14 pages
Proc. SPIE 5037, Emerging Lithographic Technologies VII, (16 June 2003); doi: 10.1117/12.484929
Show Author Affiliations
Ahmed Hassanein, Argonne National Lab. (United States)
Valeryi Sizyuk, Argonne National Lab. (United States)
Vladimir Tolkach, Argonne National Lab. (United States)
Vitali Morozov, Argonne National Lab. (United States)
Bryan J. Rice, Intel Corp. (United States)


Published in SPIE Proceedings Vol. 5037:
Emerging Lithographic Technologies VII
Roxann L. Engelstad, Editor(s)

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