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Proceedings Paper

Optoelectronic system for size inspection of round through holes in sieves
Author(s): D. N. Bondar; N. V. Budanov; A. V. Budantsev; E. L. Emelyanov; Yu. V. Obidin; V. I. Paterikin; K. V. Petukhov; A. K. Potashnikov
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Paper Abstract

Results of work on development of an optoelectronic system for size inspection of holes in sieves used in the industry for separation of diamonds are described. A description and analysis of techniques for estimating the size of holes represented by images are made, technical solutions determining the basic metrological parameters of the optoelectronic system for inspection of diameter and of the intercenter distance of round trough holes in sieves are studied. Result of studying the algorithm for estimation of the hole size ensuring an error of no more than 0.02% of the image size are discussed. Characteristics of analytical sieves automatic checking are given. The developed inspection system has the working field of 200x200 mm, the diameter measurement error of no more than 3 ?m, and the intercenter distance of 5 ?m. The time of measurement of one hole is 0.2 sec.

Paper Details

Date Published: 29 July 2002
PDF: 8 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484630
Show Author Affiliations
D. N. Bondar, JSC ALROSA (Russia)
N. V. Budanov, JSC ALROSA (Russia)
A. V. Budantsev, Technological Design Institute of Scientific Instrument Engineering (Russia)
E. L. Emelyanov, Technological Design Institute of Scientific Instrument Engineering (Russia)
Yu. V. Obidin, Technological Design Institute of Scientific Instrument Engineering (Russia)
V. I. Paterikin, Technological Design Institute of Scientific Instrument Engineering (Russia)
K. V. Petukhov, Technological Design Institute of Scientific Instrument Engineering (Russia)
A. K. Potashnikov, Technological Design Institute of Scientific Instrument Engineering (Russia)


Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life

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