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Proceedings Paper

Optoelectronic systems for a noncontact dimensional inspection of the cylindrical items in atomic industry
Author(s): A. N. Baybakov; Yuri V. Chugui; Yu. K. Karlov; K. P. Kascheev; K. I. Koutchinski; Vladimir I. Ladygin; V. G. Marchenko; A. A. Palekhin; Alexander I. Pastushenko; R. D. Pchelkin; Sergey V. Plotnikov; V. V. Rozhkov; M. V. Shindryaev; N. T. Tukubaev; Sergey P. Yunoshev; Yu. A. Zhukov
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Paper Abstract

The optoelectronic systems for noncontact dimensional inspection of cylindrical items applied to atomic industry are presented. The structural schemes of the proposed systems, the technical performances and results of their practical application are given. Inaccuracy of measurements is ± 0.01 — ± 0.03 mm. The inspection capacity is a few hundreds of items per hour. At present these systems are under operating conditions as an integral part of the technological process of the atomic items production.

Paper Details

Date Published: 29 July 2002
PDF: 7 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484612
Show Author Affiliations
A. N. Baybakov
Yuri V. Chugui, Technological Design Institute of Scientific Instrument Engineering (Russia)
Yu. K. Karlov, JSC Novosibirsk Chemical Concentrate Plant (Russia)
K. P. Kascheev, Technological Design Institute of Scientific Instrument Engineering (Russia)
K. I. Koutchinski, Technological Design Institute of Scientific Instrument Engineering (Russia)
Vladimir I. Ladygin, Technological Design Institute of Scientific Instrument Engineering (Russia)
V. G. Marchenko, JSC Novosibirsk Chemical Concentrate Plant (Russia)
A. A. Palekhin, JSC Novosibirsk Chemical Concentrate Plant (Russia)
Alexander I. Pastushenko, Technological Design Institute of Scientific Instrument Engineering (Russia)
R. D. Pchelkin, JSC Novosibirsk Chemical Concentrate Plant (Russia)
Sergey V. Plotnikov, Technological Design Institute of Scientific Instrument Engineering (Russia)
V. V. Rozhkov, JSC Novosibirsk Chemical Concentrate Plant (Russia)
M. V. Shindryaev, JSC Novosibirsk Chemical Concentrate Plant (Russia)
N. T. Tukubaev, Technological Design Institute of Scientific Instrument Engineering (Russia)
Sergey P. Yunoshev, Technological Design Institute of Scientific Instrument Engineering (Russia)
Yu. A. Zhukov, JSC Novosibirsk Chemical Concentrate Plant (Russia)


Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)

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