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Proceedings Paper

Residual reflectivity of amplification media for extended-cavity laser
Author(s): B. Ruzicka; Josef Lazar; O. Wilfert; Pavel Pokorny
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Paper Abstract

This paper presents experimental results obtained by a deposition double-layer system made by means of the electron-beam vacuum evaporation technique. We used short-wavelength 633 -635 nm laser diodes. The wavelengths of these devices are close to the wavelengths of traditional He-Ne lasers. We use them in an extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring the "modulation depth" of the coated diode emission spectra. Our best results were obtained for reflectivities well below 10-4 and repeatability ofthe deposition process in a range not exceeding 2x10-4.

Paper Details

Date Published: 29 July 2002
PDF: 5 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484579
Show Author Affiliations
B. Ruzicka, Institute of Scientific Instruments (Czech Republic)
Josef Lazar, Institute of Scientific Instruments (Czech Republic)
O. Wilfert, Univ. of Technology (Czech Republic)
Pavel Pokorny, Institute of Scientific Instruments (Czech Republic)


Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)

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