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Proceedings Paper

Shack-Hartmann wavefront sensor for beam quality measurements
Author(s): Alexis V. Kudryashov; Vladislav Ya. Panchenko; Valentina Ye. Zavalova
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Paper Abstract

This paper presents an algorithm and results of measurements of beam quality (M2). The algorithm is based on measurements performed by a Shack-Hartmann wavefront sensor (SHWS). The SHWS was designed to investigate the phase distortions of optical fields. Various wavefront parameters, such as Zernike coefficients of phase expansion, Peak-to-Valley, root-mean-square and intensity distribution, are obtained by using the SHWS. Some results of wavefront measurements are presented in this paper. The sensor developed can be widely used not only in scientific investigations and diagnostics, but also in adaptive optical systems to compensate for the phase aberrations.

Paper Details

Date Published: 29 July 2002
PDF: 8 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484575
Show Author Affiliations
Alexis V. Kudryashov, Institute on Laser and Information Technologies (Russia)
Vladislav Ya. Panchenko, Institute on Laser and Information Technologies (Russia)
Valentina Ye. Zavalova, Institute on Laser and Information Technologies (Russia)


Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)

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