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Proceedings Paper

Applications of x-ray interferometry in metrology and phase-contrast imaging
Author(s): Giovanni Mana
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Paper Abstract

X-ray interferometry makes important contributions in several fields, such as the improvement of a set of self-consistent fundamental physical constants, the linking between macroscopic and microscopic length scales, the metrology of atomicscale displacements, and the x-ray topography and tomography. This paper reviews x-ray interferomery by describing the principles of operation and the most important features of combined x-ray and optical interferometry, with emphasis on the scientific and technological challenges still deserving particular attention.

Paper Details

Date Published: 29 July 2002
PDF: 12 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484565
Show Author Affiliations
Giovanni Mana, IMGC-CNR (Italy)


Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)

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