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Proceedings Paper

Extended-cavity semiconductor lasers in fundamental metrology
Author(s): Josef Lazar; Ondrej Cip; Petr Jedlicka; B. Ruzicka
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Paper Abstract

We present the design of several types of extended-cavity lasers (ECL) based on the Littman1 configuration and an arrangement for an external stabilizating scheme employing Doppler-free saturation spectroscopy in the molecular iodine. The ECLs followed the requirements of metrological applications where the stress has been put to mechanical stability, thermal control, narrow linewidth and a mode-hop free tuning range. We developed the technique of antireflection coatings of the laser diodes front facets which proved to be a crucial step towards the internal cavity suppression and propper operation of the ECL. To control the laser optical frequency an electronics consisting of a precise thermal control and a current source with a protective circuitry was designed.

Paper Details

Date Published: 29 July 2002
PDF: 7 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484546
Show Author Affiliations
Josef Lazar, Institute of Scientific Instruments (Czech Republic)
Ondrej Cip, Institute of Scientific Instruments (Czech Republic)
Petr Jedlicka, Institute of Scientific Instruments (Czech Republic)
B. Ruzicka, Institute of Scientific Instruments (Czech Republic)


Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)

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