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Proceedings Paper

Possibility of remote sensing of surface roughness with a projector microscope based on a copper vapor optical quantum generator
Author(s): Vladimir Ya. Mendeleev; Vyatcheslav T. Karpukhin; Ivan I. Klimovskii; Michael M. Malikov; Sergey N. Skovorod'ko; A. V. Kourilovich
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Paper Abstract

Rough surfaces were illuminated by yellow (?=O.5782 ?m) and green (?=O.5106 ?m) light of a copper vapor optical quantum generator, and the light scattered from the surfaces passed through a projector microscope. The microscope included a laser tube of the quantum generator and a Glan prism placed inside an unstable resonator of the quantum generator. Slightly and very rough steel surfaces with small rms slopes of roughness were studied. The original ratio between intensities of the illuminating yellow and green light was transformed by both the rough surface and the projector microscope. Rough surfaces amplified the ratio of intensities of the scattered yellow to green light and the amplification factor depended on the statistics of rough surfaces. The ratio of intensities of the yellow to green light at the output of the projector microscope increased with increasing intensity at the input of the microscope. For the relative intensity greater than 0.4, the projector microscope amplified this ratio and the ratio was attenuated by the microscope for smaller relative intensity. Two methods for measuring surface roughness are proposed.

Paper Details

Date Published: 29 July 2002
PDF: 8 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484460
Show Author Affiliations
Vladimir Ya. Mendeleev, Institute for High Temperatures (Russia)
Vyatcheslav T. Karpukhin, Institute for High Temperatures (Russia)
Ivan I. Klimovskii, Institute for High Temperatures (Russia)
Michael M. Malikov, Institute for High Temperatures (Russia)
Sergey N. Skovorod'ko, Institute for High Temperatures (Russia)
A. V. Kourilovich, Institute for High Temperatures (Russia)

Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)

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