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Proceedings Paper

High-performance tonpilz transducers utilizing d32-cut piezoelectric single crystals
Author(s): Paul W. Rehrig; Wesley S. Hackenberger; Xiaoning Jiang; Richard J. Meyer; Xuecang Geng
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Paper Abstract

High frequency sonar is becoming ever more important to the Navy through expanded use of unmanned underwater vehicles (UUV). Proposed missions for many UUV's involve shallow water operation where broad bandwidth is required making these applications ideal candidates to use single crystal piezoelectrics. In addition, many UUV sonar systems have commercial uses including oceanographic research, oil and mineral prospecting, salvage, and undersea equipment inspection and maintenance. The properties of single crystal piezoelectrics were exploited for broad bandwidth, high frequency sonar. Crystal sonar investigations based on Tonpilz transducers utilizing the '33' resonance mode have shown limitations on bandwidth due to less than ideal resonator aspect ratio. This is a result of the crystals' low elastic stiffness, which leads to short resonators with large lateral dimensions. To address this issue an alternative design was proposed utilizing the '32' resonance mode with the resonating length oriented along a special crystallographic cut. 'Crystals with this orientation are known to have high properties; d32 values as high as 1600 pC/N have been observed. Since prestress for such a design is applied perpendicular to the poling direction, '32' mode Tonpilz elements exhibit lower loss and higher reliability than '33' mode designs. The feasibility of such '32' mode Tonpilz resonators will be presented as determined through property measurements and finite element analysis. The targeted application for this work is broadband (>100%), high frequency (45 kHz) synthetic aperture arrays for unmanned underwater vehicles.

Paper Details

Date Published: 13 August 2003
PDF: 8 pages
Proc. SPIE 5053, Smart Structures and Materials 2003: Active Materials: Behavior and Mechanics, (13 August 2003); doi: 10.1117/12.484348
Show Author Affiliations
Paul W. Rehrig, TRS Technologies, Inc. (United States)
Wesley S. Hackenberger, TRS Technologies, Inc. (United States)
Xiaoning Jiang, TRS Technologies, Inc. (United States)
Richard J. Meyer, Applied Research Lab. (United States)
Xuecang Geng, Blatek, Inc. (United States)

Published in SPIE Proceedings Vol. 5053:
Smart Structures and Materials 2003: Active Materials: Behavior and Mechanics
Dimitris C. Lagoudas, Editor(s)

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