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Proceedings Paper

Investigation of the foaming process of metals by synchrotron radiation imaging
Author(s): Lukas Helfen; Heiko Stanzick; Joachim Ohser; Katja Schladitz; Petra Rejmankova-Pernot; John Banhart; Tilo Baumbach
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Paper Abstract

Synchrotron-radiation imaging serves as a powerful tool for the non-destructive material characterization of metallic foams. The foaming process is visualized in situ by real-time radiography in projection image sequences. The temporal evolution of foam expansion from early pore formation over pore growth up to the collapse of the foam structure are reported. Ex situ microtomography is applied to the study of statistical distribution properties at the early foaming stages. Various image processing and analysis techniques yield quantitative results concerning pore nucleation and their early formation, film rupture and foam drainage. The similarities and differences of the metal foaming process with respect to the precursor material, its processing steps and process parameters are determinable.

Paper Details

Date Published: 22 July 2003
PDF: 12 pages
Proc. SPIE 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems, (22 July 2003); doi: 10.1117/12.484282
Show Author Affiliations
Lukas Helfen, Fraunhofer-Institut fur Zerstoerungsfreie Pruefverfahren (Germany)
European Synchrotron Radiation Facility (Germany)
Heiko Stanzick, Fraunhofer-Institut Fertigungstechnik Materialforschung (Germany)
Joachim Ohser, Fraunhofer-Institut fur Techno- und Wirtschaftsmathematik (Germany)
Katja Schladitz, Fraunhofer-Institut fur Techno- und Wirtschaftsmathematik (Germany)
Petra Rejmankova-Pernot, Fraunhofer-Institut fur Zerstoerungsfreie Pruefverfahren (Germany)
European Synchrotron Radiation Facility (France)
John Banhart, Hahn-Meitner-Institut (Germany)
Tilo Baumbach, Fraunhofer-Institut fur Zerstoerungsfreie Pruefverfahren (Germany)
European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 5045:
Testing, Reliability, and Application of Micro- and Nano-Material Systems
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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