Share Email Print
cover

Proceedings Paper

X-ray microscopy
Author(s): Stanislave I. Rokhlin; Jin-Yeon Kim; B. Zoofan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Recent years have seen significant advances in both low and high energy X-ray microscopy. The image in X-ray microscopy is usually formed by differences in absorption of X-ray photons. Soft X-ray microscopy (energies below a few thousand eV) uses wavelengths under 10 nm. Since light wavelengths are approximately 500 nm, resolution is much better with X-rays. One can obtain nanoscale resolution with focused soft X-ray imaging of thin biological objects. To achieve high spatial resolution in high energy X-ray microscopy one can use focused parallel monochromatic beams produced by synchrotron radiation or one can use a microfocal X-ray source with high geometrical magnification of the image. For weakly absorbing objects the image contrast can be enhanced by X-ray refraction on inhomogeneities and phase contrast formation. The physical principles of the phase contrast technique are similar to those in optics and are based on X-ray interference. Modeling and experimental aspects of the phase contrast technique with a microfocal X-ray source and the effects of geometrical and material parameters are reviewed in some detail. Examples of phase contrast of porosity in a polymer layer and an aluminum weld are shown. The computer-simulated images are compared with images from experiment with a 5 μm microfocal X-ray source. Phase retrieval methods and phase map reconstruction from measured X-ray images are also discussed. Applications of the phase-contrast X-ray imaging include medical radiology, material science, and industrial radiography and tomography.

Paper Details

Date Published: 22 July 2003
PDF: 15 pages
Proc. SPIE 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems, (22 July 2003); doi: 10.1117/12.484277
Show Author Affiliations
Stanislave I. Rokhlin, The Ohio State Univ. (United States)
Jin-Yeon Kim, The Ohio State Univ. (United States)
B. Zoofan, The Ohio State Univ. (United States)


Published in SPIE Proceedings Vol. 5045:
Testing, Reliability, and Application of Micro- and Nano-Material Systems
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

© SPIE. Terms of Use
Back to Top