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Proceedings Paper

AFM/MFM hybrid nanocharacterization of martensitic transformation and degradation for Fe-Pd shape memory alloy
Author(s): Takayuki Suzuki; Kohei Nagatani; Kazumi Hirano; Tokuo Teramoto; Minoru Taya
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Paper Abstract

Martensitic transformation and degradation characteristics for Fe-Pd ferromagnetic shape memory alloy were investigated by the developed AFM (Atomic Force Microscope)/MFM (Magnetic Force Microscope) hybrid nano-characterization technique. In AFM martensitic transformation was detected by the changes of surface topography of martensite plates. In MFM martensitic transformation was detected by the changes of magnetic domain structures. This technique has an advantage that martensitic transformation characteristics such as martensitic transformation temperature and reverse transformation temperature can be measured at microscopic and nanoscopic small area. Degradation characteristics of martensitic transformation under cyclic loading were also detected by the changes of AFM and MFM images. In AFM images surface topography of martensite plates became flat and in MFM images the morphology of magnetic domain structures became unfocused under cyclic loading. Then it was found that the hybrid nano-characterization was very high sensitive technique to evaluate degradation for Fe-Pd ferromagnetic shape memory alloy.

Paper Details

Date Published: 22 July 2003
PDF: 10 pages
Proc. SPIE 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems, (22 July 2003); doi: 10.1117/12.484274
Show Author Affiliations
Takayuki Suzuki, National Institute of Advanced Industrial Science and Technology (Japan)
Kohei Nagatani, Univ. of Tsukuba (Japan)
Kazumi Hirano, National Institute of Advanced Industrial Science and Technology (Japan)
Tokuo Teramoto, Univ. of Tsukuba (Japan)
Minoru Taya, Univ. of Washington (United States)


Published in SPIE Proceedings Vol. 5045:
Testing, Reliability, and Application of Micro- and Nano-Material Systems
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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