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Proceedings Paper

Dependency of electric field and mechanical stress on piezoelectric strain of PZT 3203HD
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Paper Abstract

In this paper, material nonlinear behavior of PZT wafer (3202HD, CTS) under high electric field and tensile stress is experimentally investigated and the nonlinearity of the PZT wafer is numerically simulated. In the simulation, new definitions of the piezoelectric constant and the incremental strain are proposed. Empirical functions that can represent the nonlinear behavior of the PZT wafer have been extracted based on the measured piezo-strain under stress. The functions are implemented in an incremental finite element formulation for material nonlinear analysis. With the new definition of the incremental piezo-strain, the measured nonlinear behavior of the PZT wafer has been accurately reproduced even for high electric field.

Paper Details

Date Published: 13 August 2003
PDF: 7 pages
Proc. SPIE 5053, Smart Structures and Materials 2003: Active Materials: Behavior and Mechanics, (13 August 2003); doi: 10.1117/12.484202
Show Author Affiliations
Sung Hoon Jang, Konkuk Univ. (South Korea)
Young Sung Kim, Konkuk Univ. (South Korea)
Sang Ki Lee, Konkuk Univ. (South Korea)
Hoon Cheol Park, Konkuk Univ. (South Korea)
Kwang Joon Yoon, Konkuk Univ. (South Korea)


Published in SPIE Proceedings Vol. 5053:
Smart Structures and Materials 2003: Active Materials: Behavior and Mechanics
Dimitris C. Lagoudas, Editor(s)

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