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Proceedings Paper

International Center for Nano-Materials reliability
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Paper Abstract

Over the last two centuries, engineers have learned how to determine material parameters that describe the properties of construction materials and the behavior of the materials under loading conditions. These parameters are measured from small specimens that are exposed to specific laboratory test conditions, sometimes far away from the real loading conditions for the materials in use. Engineering experience is required to use these material parameters for design and to guarantee material lifetimes of several decades for complex structures and systems, like for example, aircraft. Nano-structures having completely different chemical and physical property behavior than large scale devices possess, due to the extremely large surface to volume ratio along with quantum mechanical effects. Due to cost constraints and the speed of invention and business, there will not be unlimited time as in the past to create the necessary materials testing and characterization procedures and to develop the criteria for design and construction that guarantees reliability and a long lifetime for these new materials. A concept for an international scientist's network concerning characterization modeling and reliability of micro and nano materials will be presented. Objectives for the network are to assure safety and reliability of future products, to develop and harmonize noninvasive testing procedures, to develop training programs for nano characterization and modeling specialists, and for instance, to accelerate the process of application of nano materials.

Paper Details

Date Published: 22 July 2003
PDF: 7 pages
Proc. SPIE 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems, (22 July 2003); doi: 10.1117/12.483995
Show Author Affiliations
Norbert Meyendorf, Univ. of Dayton Research Institute (United States)
Bernd Michel, Fraunhofer-Institut fur Zuverlaessigkeit und Mikrointegration (Germany)


Published in SPIE Proceedings Vol. 5045:
Testing, Reliability, and Application of Micro- and Nano-Material Systems
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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