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Proceedings Paper

Uniformity and transmission of proportional counter window materials for use with AXAF
Author(s): Kathryn A. Flanagan; Gerald K. Austin; J. C. Cobuzzi; Richard E. Goddard; John P. Hughes; Edward McLaughlin; William A. Podgorski; Vincent D. Rose; Adrian G. Roy; Martin V. Zombeck; Thomas H. Markert; James M. Bauer; Takashi Isobe; Mark L. Schattenburg
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Paper Abstract

The X-ray detection system used to calibrate the Advanced X-ray Astrophysics Facility (AXAF) mirrors will include gas flow and sealed proportional counters. To meet the ultimate 1 percent goal of the calibration project, the transmission and uniformity of the windows must be well known for the soft X-ray wavelengths involved. Various window materials for use with proportional counters are examined for transmission at X-ray wavelengths in the range of 0.1 to 5.9 keV. These include the usual window materials (polypropylene and beryllium), as well as materials only recently employed for detector applications (polyimide and diamond). The transmission uniformity of beryllium at 1.49 keV is examined with a microchannel plate detector, producing a 'shadowgraph' of the window material illuminated with soft X-rays. This technique allows us to investigate nonuniformities on a spatial scale of about .2 mm.

Paper Details

Date Published: 1 October 1991
PDF: 13 pages
Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); doi: 10.1117/12.48356
Show Author Affiliations
Kathryn A. Flanagan, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Gerald K. Austin, Harvard-Smithsonian Ctr. for Astrophysics (United States)
J. C. Cobuzzi, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Richard E. Goddard, Harvard-Smithsonian Ctr. for Astrophysics (United States)
John P. Hughes, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Edward McLaughlin, Harvard-Smithsonian Ctr. for Astrophysics (United States)
William A. Podgorski, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Vincent D. Rose, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Adrian G. Roy, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Martin V. Zombeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Thomas H. Markert, Massachusetts Institute of Technology (United States)
James M. Bauer, SUNY/Stony Brook (United States)
Takashi Isobe, Massachusetts Institute of Technology (United States)
Mark L. Schattenburg, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 1549:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II
Oswald H. W. Siegmund; Richard E. Rothschild, Editor(s)

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