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Proceedings Paper

Instrument design and test results of the new all-reflection spatial heterodyne spectrometer
Author(s): Brett C. Bush; Daniel M. Cotton; James S. Vickers; Supriya Chakrabarti
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Paper Abstract

An all-reflection spatial heterodyne spectrometer (SHS) has been recently developed. The advantages over conventional high-resolution grating spectrometers are that the SHS requires no mechanical scanning, a self-compensating optical design permits easy alignment, and it is much smaller than other spectrometers of comparable resolution. Since all beam-splits and recombinations occur by reflection off of a diffraction grating, the interferometer is capable of operating well into the extreme ultraviolet (EUV) and possibly into the soft X-ray region. A description of the design and the characteristics of the instrument is presented. Also, test results, including sample interferograms as well as their Fourier-transformed spectra, at both visible and UV wavelengths are shown. Finally, we report on future developments and possible applications.

Paper Details

Date Published: 1 October 1991
PDF: 9 pages
Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); doi: 10.1117/12.48354
Show Author Affiliations
Brett C. Bush, Univ. of California/Berkeley (United States)
Daniel M. Cotton, Univ. of California/Berkeley (United States)
James S. Vickers, Univ. of California/Berkeley (United States)
Supriya Chakrabarti, Univ. of California/Berkeley (United States)


Published in SPIE Proceedings Vol. 1549:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II
Oswald H. W. Siegmund; Richard E. Rothschild, Editor(s)

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