Share Email Print
cover

Proceedings Paper

Progress with PN-CCDs for the XMM satellite mission
Author(s): Heinrich W. Braeuninger; D. Hauff; Peter Lechner; Gerhard Lutz; W. Kink; Norbert Meidinger; Gerd Metzner; Peter Predehl; Claus Reppin; Lothar Strueder; Joachim E. Truemper; Eckhard Kendziorra; Ruediger Staubert; Veljko Radeka; Pavel Rehak; S. Rescia; Giuseppe Bertuccio; Elena Gatti; Antonio Longoni; Marco Sampietro; Nicola Findeis; Peter Holl; Josef Kemmer; Christoph von Zanthier
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

PN-CCDs are being developed as focal plane detectors for ESA's X-ray Multi-Mirror satellite mission (XMM), to be launched at the end of this century. As a part of the European Photon Imaging Camera (EPIC) the pn-CCDs will convert the incoming X-ray radiation with high quantum efficiency, low readout noise, excellent background rejection, timing in the microsec regime, radiation tolerance up to several hundreds of krads and a position resolution tailored according to the angular resolution of the telescope. The goal of our laboratorial efforts for this mission is to fabricate a monolithic pn-CCD of an active area of 6 x 6 sq cm having 768 on-chip JFET amplifiers located at the end of each CCD line. It is the aim of this contribution to report on the ongoing work of the pn-CCD system. This article focuses on the position resolution capabilities of fully depleted pn-CCDs, some recent results in the noise analysis and preliminary results on 10 MeV proton damage.

Paper Details

Date Published: 1 October 1991
PDF: 10 pages
Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); doi: 10.1117/12.48351
Show Author Affiliations
Heinrich W. Braeuninger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
D. Hauff, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Peter Lechner, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Gerhard Lutz, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
W. Kink, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Norbert Meidinger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Gerd Metzner, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Peter Predehl, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Claus Reppin, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Lothar Strueder, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Joachim E. Truemper, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Eckhard Kendziorra, Univ. Tuebingen (Germany)
Ruediger Staubert, Univ. Tuebingen (Germany)
Veljko Radeka, Brookhaven National Lab. (United States)
Pavel Rehak, Brookhaven National Lab. (United States)
S. Rescia, Brookhaven National Lab. (United States)
Giuseppe Bertuccio, Politecnico di Milano (Italy)
Elena Gatti, Politecnico di Milano (Italy)
Antonio Longoni, Politecnico di Milano (Italy)
Marco Sampietro, Politecnico di Milano (Italy)
Nicola Findeis, KETEK GmbH (Germany)
Peter Holl, KETEK GmbH (Germany)
Josef Kemmer, KETEK GmbH (Germany)
Christoph von Zanthier, KETEK GmbH (Germany)


Published in SPIE Proceedings Vol. 1549:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II
Oswald H. W. Siegmund; Richard E. Rothschild, Editor(s)

© SPIE. Terms of Use
Back to Top