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Proceedings Paper

Diode-laser-based diagnostic for NCl(X)
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Paper Abstract

We present preliminary results of an effort to develop an ultra-sensitive, diode laser-based diagnostic for NCl(X), an important species in the all gas phase iodine laser. This system uses a narrow band, tunable diode laser to probe transitions within the (0,0) band of the NCl(b - X) system near 662 nm. We provide a description of our detection and calibration strategies and present initial calibration results.

Paper Details

Date Published: 5 June 2003
PDF: 8 pages
Proc. SPIE 4971, Gas and Chemical Lasers and Intense Beam Applications IV, (5 June 2003); doi: 10.1117/12.483500
Show Author Affiliations
Steven J. Davis, Physical Sciences, Inc. (United States)
Phillip A. Mulhall, Physical Sciences Inc. (United States)
William J. Kessler, Physical Sciences Inc. (United States)
Michael C. Heaven, Emory Univ. (United States)
Gerald C. Manke II, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 4971:
Gas and Chemical Lasers and Intense Beam Applications IV
Steven J. Davis; Michael C. Heaven, Editor(s)

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