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Proceedings Paper

Performance of milliKelvin Si bolometers as x-ray and exotic particle detectors
Author(s): C. C. Zammit; Timothy J. Sumner; M. J. Lea; P. Fozooni; Ian D. Hepburn
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Paper Abstract

Silicon bolometers are currently under development for milliKelvin operation; these devices are being produced using Si wafer fabrication technology. The design and performance of individual bolometers, using doped layers with a thickness in the range 0.1 to 3 (mu) , are described. The use of epitaxial growth to replace ion implantation for improved performance is described and initial results reported.

Paper Details

Date Published: 1 October 1991
PDF: 9 pages
Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); doi: 10.1117/12.48345
Show Author Affiliations
C. C. Zammit, Imperial College of Science, Technology and Medicine (United Kingdom)
Timothy J. Sumner, Imperial College of Science, Technology and Medicine (United Kingdom)
M. J. Lea, Royal Holloway and Bedford New College (United Kingdom)
P. Fozooni, Royal Holloway and Bedford New College (United Kingdom)
Ian D. Hepburn, Queen Mary and Westfield College (United Kingdom)


Published in SPIE Proceedings Vol. 1549:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II
Oswald H. W. Siegmund; Richard E. Rothschild, Editor(s)

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