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Proceedings Paper

Multilayer multilevel storage testing system
Author(s): Hui Zhao; Guosheng Qi; Duanyi Xu; Xuesong Mai; Lei Zhang
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Paper Abstract

A novel storage system is introduced which bases on the "multilayer multilevel storage model." Three kinds of lasers that are different in wavelength are used to record data or test some storage material in this system. An example that is testing the photochromic material is also introduced to explain the usage of the system in testing storage material.

Paper Details

Date Published: 17 September 2002
PDF: 6 pages
Proc. SPIE 4930, Advanced Optical Storage Technology, (17 September 2002); doi: 10.1117/12.483359
Show Author Affiliations
Hui Zhao, Tsinghua Univ. (China)
Guosheng Qi, Tsinghua Univ. (China)
Duanyi Xu, Tsinghua Univ. (China)
Xuesong Mai, Tsinghua Univ. (China)
Lei Zhang, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 4930:
Advanced Optical Storage Technology
Duanyi Xu; Seiya Ogawa, Editor(s)

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