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Proceedings Paper

Electrochromism of sputtered nickel oxide films
Author(s): Xuping Zhang; Jieying Tang; Yueming Sun
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Paper Abstract

The X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) were used to analysis the chemical composition and valence of sputtered electrochromic nickel oxide films is as-deposited, fully bleached and colored states. Experimental results showed that no Ni(OH)2 exists in these three states. Potassium adsorbs at the NiO film surface instead of entering the lattice of nickel vacancies when the nickel oxide films were coloring/bleaching cycled in KOH solution. And the chemical valence of Ni does not seem to change after coloring and bleaching. A new electrochromism for sputtered nickel oxide films in aqueous electrolytes is proposed.

Paper Details

Date Published: 17 September 2002
PDF: 8 pages
Proc. SPIE 4930, Advanced Optical Storage Technology, (17 September 2002); doi: 10.1117/12.483328
Show Author Affiliations
Xuping Zhang, Nanjing Univ. (China)
Jieying Tang, Southeast Univ. (China)
Yueming Sun, Southeast Univ. (China)


Published in SPIE Proceedings Vol. 4930:
Advanced Optical Storage Technology
Duanyi Xu; Seiya Ogawa, Editor(s)

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