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Proceedings Paper

Near-field aperture property of a nanometer AgOx thin film
Author(s): Fu Han Ho; Hsun Hao Chang; Yu Hsaun Lin; Din Ping Tsai
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Paper Abstract

AgOx thin-films were studied by using an optical read-write-tester. Two different states were found by CCD and SEM images, and the optical properties were examined by the pump-probe technique. A scattering center was found in the AgOx thin film. The enhanced reflectance was due to strongly local scattering and plasmon excitations.

Paper Details

Date Published: 17 September 2002
PDF: 6 pages
Proc. SPIE 4930, Advanced Optical Storage Technology, (17 September 2002); doi: 10.1117/12.483309
Show Author Affiliations
Fu Han Ho, National Taiwan Univ. (Taiwan)
Hsun Hao Chang, National Taiwan Univ. (Taiwan)
Yu Hsaun Lin, National Taiwan Univ. (Taiwan)
Din Ping Tsai, National Taiwan Univ. (Taiwan)


Published in SPIE Proceedings Vol. 4930:
Advanced Optical Storage Technology
Duanyi Xu; Seiya Ogawa, Editor(s)

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