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Proceedings Paper

Real-time weld defect inspection system in x-ray images
Author(s): Yi Sun; En-Liang Wang; Peng Zhou; Mohan Li
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Paper Details

Date Published: 16 September 2002
PDF: 6 pages
Proc. SPIE 4929, Optical Information Processing Technology, (16 September 2002); doi: 10.1117/12.483225
Show Author Affiliations
Yi Sun, Dalian Univ. of Technology (China)
En-Liang Wang, Dalian Univ. of Technology (China)
Peng Zhou, Dalian Univ. of Technology (China)
Mohan Li, Dalian Univ. of Technology (China)

Published in SPIE Proceedings Vol. 4929:
Optical Information Processing Technology
Guoguang Mu; Francis T. S. Yu; Suganda Jutamulia, Editor(s)

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