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Proceedings Paper

One-dimensional proportional counters for x-ray all-sky monitors
Author(s): Masaru Matsuoka; Masamitsu Yamauchi; Haruo Nakamura; M. Kondo; Nobuyuki Kawai; Atsumasa Yoshida; Tohru Imai
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Paper Abstract

The X-ray detection system used to calibrate the Advanced X-ray Astrophysics Facility (AXAF) mirrors will include gas flow and sealed proportional counters. To meet the ultimate 1 percent goal of the calibration project, the transmission and uniformity of the windows must be well known for the soft X-ray wavelengths involved. Various window materials for use with proportional counters are examined for transmission at X-ray wavelengths in the range of 0.1 to 5.9 keV. These include the usual window materials (polypropylene and beryllium), as well as materials only recently employed for detector applications (polyimide and diamond). The transmission uniformity of beryllium at 1.49 keV is examined with a microchannel plate detector, producing a 'shadowgraph' of the window material illuminated with soft X-rays. This technique allows us to investigate nonuniformities on a spatial scale of about .2 mm.

Paper Details

Date Published: 1 October 1991
PDF: 7 pages
Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); doi: 10.1117/12.48321
Show Author Affiliations
Masaru Matsuoka, Institute of Physical and Chemical Research (Japan)
Masamitsu Yamauchi, Institute of Physical and Chemical Research (Japan)
Haruo Nakamura, Institute of Physical and Chemical Research (Japan)
M. Kondo, Institute of Physical and Chemical Research (Japan)
Nobuyuki Kawai, Institute of Physical and Chemical Research (Japan)
Atsumasa Yoshida, Institute of Physical and Chemical Research (Japan)
Tohru Imai, Institute of Physical and Chemical Research (Japan)


Published in SPIE Proceedings Vol. 1549:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II
Oswald H. W. Siegmund; Richard E. Rothschild, Editor(s)

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