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Proceedings Paper

Application of wavelet transform in characterization of fabric texture
Author(s): Chandra Shakher; S. M. Istiaque; Shashi Kumar Singh
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Paper Abstract

In this paper we present an opto-vision system for image processing of fabric texture using symlet wavelet transform to locate different types of defects in fabric and find the repeat texture of fabric without any priori information. The system is also capable of characterizing the texture of fabric not having obvious repeat pattern. The proposed methodology is able to measure the warp, weft diameter and spacing per unit length per yarn and percentage of their coefficient of variation (C.V%). The two dimensional wavelet transform of the image can distinguish texture feature along with yarn spacing in the weave. The information obtained from the image processing is considered to be significant for purposes of textile design to obtain a basic knowledge as to the visual information contained therein.

Paper Details

Date Published: 16 September 2002
PDF: 7 pages
Proc. SPIE 4929, Optical Information Processing Technology, (16 September 2002); doi: 10.1117/12.483207
Show Author Affiliations
Chandra Shakher, Indian Institute of Technology Delhi (India)
S. M. Istiaque, Indian Institute of Technology Delhi (India)
Shashi Kumar Singh, Indian Institute of Technology Delhi (India)


Published in SPIE Proceedings Vol. 4929:
Optical Information Processing Technology
Guoguang Mu; Francis T. S. Yu; Suganda Jutamulia, Editor(s)

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