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Proceedings Paper

Pattern recognition for optical PSI images of surface topography using wavelets
Author(s): Xiangqian Jiang; Shaojun Xiao; Liam Blunt
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Paper Abstract

This paper proposes a novel philosophical approach using Wavelet and Radon Transform for addressing topographical features of surface from a PSI image. In this work, a combined technique using the Wavelet and Radon Transforms has been investigated and developed to achieve the forensic dissection of PSI image data. As a result, the isolated point-like features on a PSI image can be extracted using the wavelet transform with artifact free thresholding method, and the curve-like features on a PSI image can be identified using the Ridgelet Transform (Multi-Wavelet-Radon transform). Case studies are conducted using a series of femoral heads to demonstrate the application of using the new wavelet model in the assessment PSI images of these surfaces.

Paper Details

Date Published: 16 September 2002
PDF: 9 pages
Proc. SPIE 4929, Optical Information Processing Technology, (16 September 2002); doi: 10.1117/12.483206
Show Author Affiliations
Xiangqian Jiang, Huazhong Univ. of Science and Technology and Univ. of Huddersfield (United Kingdom)
Shaojun Xiao, Huazhong Univ. of Science and Technology and Univ. of Huddersfield (China)
Liam Blunt, Huazhong Univ. of Science and Technology and Univ. of Huddersfield (United Kingdom)


Published in SPIE Proceedings Vol. 4929:
Optical Information Processing Technology
Guoguang Mu; Francis T. S. Yu; Suganda Jutamulia, Editor(s)

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