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Proceedings Paper

Optical materials: evaluation methodology and data base utility
Author(s): Charles E. Patty; David M. McMahon
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Paper Abstract

The development of advanced infrared optical materials has necessitated a growing requirement for refined optical and mechanical evaluation methodologies, as well as a need for an accurate, updated, optical and mechanical properties data based. Driving this need are new material fabrication and finishing techniques--often substantially different from past methods-- that can lead to optical and material properties data that is significantly at variance with data contained in the current infrared materials data based. In addition, both new and well established measurement methodologies are being applied to measurement problems that are qualitatively different from that for which they were originally developed. An overview of an optical and mechanical reliability evaluation methodology, along with representative data, is discussed.

Paper Details

Date Published: 1 November 1991
PDF: 14 pages
Proc. SPIE 1535, Passive Materials for Optical Elements, (1 November 1991); doi: 10.1117/12.48299
Show Author Affiliations
Charles E. Patty, Teledyne Brown Engineering (United States)
David M. McMahon, Teledyne Brown Engineering (United States)


Published in SPIE Proceedings Vol. 1535:
Passive Materials for Optical Elements
Gary W. Wilkerson, Editor(s)

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