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Proceedings Paper

Reliability of 1.3-um VCSELs for metro area networks
Author(s): Simon R. Prakash; Leo M. F. Chirovsky; Ryan L. Naone; David Galt; Dave W. Kisker; Andrew W. Jackson
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Paper Abstract

Vertical Cavity Surface Emitting Lasers (VCSELs) have been widely adopted in the 850nm data communications markets with great success. Using this technology as a basis, we have developed a 1.3 μm InGaAsN VCSEL and VCSEL Array technology for telecommunications applications. Since the reliability requirement of this market is less than 150 FITs over 20 years, we focused a great deal of development time on the reliability of the device, and so far have been able to predict an MTTF of over 13 million hours or 71 FITs. This report provides a brief summary of the characteristics of the VCSEL in various stress conditions and the methodology used to measure both the wear-out and random failure rates of the devices.

Paper Details

Date Published: 17 June 2003
PDF: 11 pages
Proc. SPIE 4994, Vertical-Cavity Surface-Emitting Lasers VII, (17 June 2003); doi: 10.1117/12.482853
Show Author Affiliations
Simon R. Prakash, Optical Communication Products (United States)
Leo M. F. Chirovsky, Optical Communication Products (United States)
Ryan L. Naone, Optical Communication Products (United States)
David Galt, Optical Communication Products (United States)
Dave W. Kisker, Optical Communication Products (United States)
Andrew W. Jackson, Optical Communication Products (United States)

Published in SPIE Proceedings Vol. 4994:
Vertical-Cavity Surface-Emitting Lasers VII
Chun Lei; Sean P. Kilcoyne, Editor(s)

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