Share Email Print

Proceedings Paper

Rigidity test of large and high-precision instruments
Author(s): Pin-Zhong Ma
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This article describes several methods for rapidly and continuously measuring the rigidity of both dynamic and static with large high-precision instruments. It also provides some examples of measuring methods with large M.M. wavelength radio and large optical telescope.

Paper Details

Date Published: 1 December 1991
PDF: 10 pages
Proc. SPIE 1532, Analysis of Optical Structures, (1 December 1991); doi: 10.1117/12.48264
Show Author Affiliations
Pin-Zhong Ma, Nanjing Astronomical Instrument Factory (China)

Published in SPIE Proceedings Vol. 1532:
Analysis of Optical Structures
Donald C. O'Shea, Editor(s)

© SPIE. Terms of Use
Back to Top