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Proceedings Paper

Reliability and commercialization of oxidized VCSEL
Author(s): Alice Li; Jin-Shan Pan; Horng-Ching Lai; Bor-Lin Lee; Jack Wu; Yung-Sen Lin; Tai-Chan Huo; Calvin Wu; Kai-Feng Huang
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Paper Abstract

The reliability of oxidized VCSEL has similar result to implanted VCSEL. This paper presents our work on reliability data of oxidized VCSEL device and also the comparison with implanted VCSEL. The MTTF of oxidized VCSEL is 2.73 x 106 hrs at 55°C, 6 mA and failure rate ~ 1 FITs for the first 2 years operation. The reliability data of oxidized VCSEL includes activation energy, MTTF (mean-time-to failure), failure rate prediction, and 85°C / 85% humidity test will be presented below. Commercialization of oxidized VCSEL is demonstrated such as VCSEL structure, manufacturing facility, and packaging. A cost effective approach is key to its success in applications such as Datacomm.

Paper Details

Date Published: 17 June 2003
PDF: 9 pages
Proc. SPIE 4994, Vertical-Cavity Surface-Emitting Lasers VII, (17 June 2003); doi: 10.1117/12.482636
Show Author Affiliations
Alice Li, TrueLight Corp. (Taiwan)
Jin-Shan Pan, TrueLight Corp. (Taiwan)
Horng-Ching Lai, TrueLight Corp. (Taiwan)
Bor-Lin Lee, TrueLight Corp. (Taiwan)
Jack Wu, TrueLight Corp. (Taiwan)
Yung-Sen Lin, TrueLight Corp. (Taiwan)
Tai-Chan Huo, TrueLight Corp. (Taiwan)
Calvin Wu, TrueLight Corp. (Taiwan)
Kai-Feng Huang, National Chiao Tung Univ. (Taiwan)

Published in SPIE Proceedings Vol. 4994:
Vertical-Cavity Surface-Emitting Lasers VII
Chun Lei; Sean P. Kilcoyne, Editor(s)

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