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Proceedings Paper

Highly reliable oxide VCSELs for datacom applications
Author(s): Ian Aeby; Doug Collins; Brian Gibson; Christopher J. Helms; Hong Q. Hou; Wenlin Lou; David J. Bossert; Charlie X. Wang
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Paper Abstract

In this paper we describe the processes and procedures that have been developed to ensure high reliability for Emcore’s 850 nm oxide confined GaAs VCSELs. Evidence from on-going accelerated life testing and other reliability studies that confirm that this process yields reliable products will be discussed. We will present data and analysis techniques used to determine the activation energy and acceleration factors for the dominant wear-out failure mechanisms for our devices as well as our estimated MTTF of greater than 2 million use hours. We conclude with a summary of internal verification and field return rate validation data.

Paper Details

Date Published: 17 June 2003
PDF: 10 pages
Proc. SPIE 4994, Vertical-Cavity Surface-Emitting Lasers VII, (17 June 2003); doi: 10.1117/12.482633
Show Author Affiliations
Ian Aeby, EMCORE Fiber Optics (United States)
Doug Collins, EMCORE Fiber Optics (United States)
Brian Gibson, EMCORE Fiber Optics (United States)
Christopher J. Helms, EMCORE Fiber Optics (United States)
Hong Q. Hou, EMCORE Fiber Optics (United States)
Wenlin Lou, EMCORE Fiber Optics (United States)
David J. Bossert, EMCORE Fiber Optics (United States)
Charlie X. Wang, EMCORE Fiber Optics (United States)

Published in SPIE Proceedings Vol. 4994:
Vertical-Cavity Surface-Emitting Lasers VII
Chun Lei; Sean P. Kilcoyne, Editor(s)

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