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Proceedings Paper

Degradation mechanisms in group-III nitride devices
Author(s): Daniel L. Barton; Marek Osinski
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Paper Details

Date Published: 29 August 2002
Hard Copy: 24 pages
Proc. SPIE CR83, Gallium-Nitride-based Technologies, (29 August 2002);
Show Author Affiliations
Daniel L. Barton, Sandia National Labs. (United States)
Marek Osinski, CHTM/Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. CR83:
Gallium-Nitride-based Technologies
Marek Osinski, Editor(s)

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