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Proceedings Paper

Nonoptical noncoherent imaging in industrial testing
Author(s): Z. A. Delecki; Moe A. Barakat
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Paper Abstract

A method is described for generation of an image from measurements of weak electromagnetic signals in a region close to their source. A computer-assisted contactless test system consists of an array of sensors exposed to the reactive electric and magnetic fields surrounding the printed circuit-board assembly. In a reference plane located a distance small in comparison to the wavelength a probe antenna scans the fields generated by its source; the signal from the sensor is acquired in the frequency domain by a spectrum analyzer and then transferred to a controlling computer. Measurements are made on a regularly spaced grid in a plane parallel to the board. A noncoherent estimate of pixel value is defined. This estimate is computed for each node of a grid. A practical implementation of the method and a simple fault detection technique are presented.

Paper Details

Date Published: 1 September 1991
PDF: 11 pages
Proc. SPIE 1526, Industrial Vision Metrology, (1 September 1991); doi: 10.1117/12.48245
Show Author Affiliations
Z. A. Delecki, National Research Council Canada (Canada)
Moe A. Barakat, National Research Council Canada (Canada)

Published in SPIE Proceedings Vol. 1526:
Industrial Vision Metrology
Sabry F. El-Hakim, Editor(s)

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