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Proceedings Paper

High-accuracy edge-matching with an extension of the MPGC-matching algorithm
Author(s): Armin Gruen; Dirk Stallmann
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Paper Abstract

In industrial dimensional inspection and quality control there is an increasing need for fast and automatic high-accuracy measurement systems. For vision systems to match these requirements all system components have to be tuned carefully. A key role in such a system is played by the measurement algorithm. This paper demonstrates how the area-based multi- photo geometrical constrained (MPGC) matching algorithm can be modified for the highly accurate measurement of object edges. It can be expected that this algorithm allows the measurement of nontargeted but well-defined object features with a relative accuracy of 1:25000.

Paper Details

Date Published: 1 September 1991
PDF: 14 pages
Proc. SPIE 1526, Industrial Vision Metrology, (1 September 1991); doi: 10.1117/12.48235
Show Author Affiliations
Armin Gruen, ETH-Hoenggerberg (Switzerland)
Dirk Stallmann, ETH-Hoenggerberg (Switzerland)

Published in SPIE Proceedings Vol. 1526:
Industrial Vision Metrology
Sabry F. El-Hakim, Editor(s)

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