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Proceedings Paper

Multiphysics modeling of intracavity-contacted VCSELs
Author(s): Brian P. Riely; J. Jiang Liu; Hongen Shen; Gerard Dang; Wayne H. Chang; Y. Jiang; Z. Sikorski; T. Czyszanowski; Andrzej J. Przekwas
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Paper Abstract

The design of the next generation of vertical-cavity surface-emitting lasers (VCSELs) will greatly depend on the availability of accurate modeling tools. Comprehensive models of semiconductor lasers are needed to predict realistic behavior of various laser devices, such as the spatially nonuniform gain that results from current crowding. Advanced physics models for VCSELs require benchmark quality experimental data for model validation. This paper presents preliminary results of a collaborative effort at ARL to fabricate and experimentally characterize test optoelectronic structures and VCSEL devices, and at CFDRC to develop comprehensive multiphysics modeling, design and optimization tools for semiconductor lasers and photodetectors. Experimental characterization procedure and measurements of optical and electrical data for oxide-confined intracavity VCSELs are presented. A comprehensive multiphysics modeling tools CFD-ACE+ O’SEMI has been developed. The modeling tool integrates electronic, optical, thermal, and material gain data models for the design of VCSELs and edge emitting lasers (EELs). This paper presents multidimensional simulation analysis of current crowding in oxide-confined intracavity VCSELs. Computational results helped design the test structures and devices and are used as a guide for experimental measurements performed at ARL.

Paper Details

Date Published: 25 July 2003
PDF: 12 pages
Proc. SPIE 4986, Physics and Simulation of Optoelectronic Devices XI, (25 July 2003); doi: 10.1117/12.482321
Show Author Affiliations
Brian P. Riely, Army Research Lab. (United States)
J. Jiang Liu, Army Research Lab. (United States)
Hongen Shen, Army Research Lab. (United States)
Gerard Dang, Army Research Lab. (United States)
Wayne H. Chang, Army Research Lab. (United States)
Y. Jiang, CFD Research Corp. (United States)
Z. Sikorski, CFD Research Corp. (United States)
T. Czyszanowski, CFD Research Corp. (United States)
Andrzej J. Przekwas, CFD Research Corp. (United States)

Published in SPIE Proceedings Vol. 4986:
Physics and Simulation of Optoelectronic Devices XI
Marek Osinski; Hiroshi Amano; Peter Blood, Editor(s)

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